KRISS develops ultra-precise technology to count damaged DNA fragments
KRISS develops ultra-precise technology to count damaged DNA fragments
https://www.eurekalert.org/news-releases/1133182
Publish Date: 2026-06-25 09:46:00
Source Domain: www.eurekalert.org
Article Highlight | 25-Jun-2026
New platform detects up to 22 times more DNA damage repair fragments, supporting personalized cancer treatment and early cancer risk diagnosis
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▲ Research team developing the ultra-sensitive platform for analyzing damaged DNA fragments
(Front row, clockwise from left: Dr. Kwon Ha-Jeong, Principal Research Scientist; Kim Youngmin, UST Student Researcher; Kim Geun Hoe, UST Student Researcher; Dr. Choi Jun-Hyuk, Principal Research Scientist)
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Credit: Korea Research Institute of Standards and Science (KRISS)
The Korea Research Institute of Standards and Science (KRISS, President Dr. Lee Ho Seong) has developed an ultra-sensitive immunoassay-based analytical platform that can detect and quantify trace amounts of “Small Excised Damaged DNA (sedDNA)” fragments generated during cellular DNA repair. This technology enables highly sensitive detection with quantification down to the level of several thousand molecules, measuring up to 22 times more DNA fragments than conventional methods. It provides a new analytical foundation for comparing DNA repair capacity between individuals and studying cellular responses to anticancer drugs and carcinogenic agents.
Human DNA…
